Electron Microscopy Characterisation of Organic-Inorganic Interfaces

On the 22nd February 2016, the Royal Microscopical Society hosted a workshop at Queen Mary University of London under the title ‘Electron Microscopy Characterisation of Organic-Inorganic Interfaces‘. The meeting addressed the progress in using electron microscopy to study organic materials. Traditionally this is challenging because the energy and number of electrons passing through organic material can very quickly destroy its structure. However, with advancements in electron detection and microscope automation, images can now be acquired before the damage is done by the beam.

There were many interesting talks covering a range of samples, from museum specimens to magnetic organisms. Probably the closest related work was in studying defects in graphene, presented by Professor Angus Kirkland from University of Oxford. They had used the electron beam as an intense spot to create defects, followed by using it in a more-spread, less-intense beam to study what had been created. They could even watch how these defects move through the graphene lattice, nudged along by the energy of the electron beam.

I presented our work on vanadyl phthalocyanine (VOPc) on graphene as a poster during the meeting (a write-up of this work can be found here). VOPc, like many other organic materials, is very difficult to study with electron microscopy as it damages so quickly. By carefully controlling the microscope, we could take images of the VOPc molecules just at the point they are exposed to the electron beam, and get meaningful information about them before they are destroyed shortly after.

Leave a Reply

Your email address will not be published. Required fields are marked *